- Supports scan format of target ATE.
- Optionally, flattens source scan format into broad-side ATE patterns.
- Supports scan data compression of target ATE.
- Supports multiple waveform tables.
- Supports vector repeats and loops.
- Provides filters for eliminating artifacts contained in the STIL/WGL files from EDA tools.
- Low cost.
- Enables usage of standard ATE w/o scan hardware for scan test.