Contact Us
Simutest Inc
4800 Great America Parkway,
Suite 408,
Santa Clara. CA.
USA. 95054
Tel: 408-988-4032
Fax: 408-988-4034
Welcome to Simutest
Product Information : Scan Converter
The Scan Converter is low cost and versatile test pattern translation software. The Scan Converter efficiently converts STIL or WGL files, generated by EDA tools into the test programs for more than 70 models from most major ATE systems including those from Advantest, Verigy, Teradyne, and Credence.
  • Supports scan format of target ATE.
  • Optionally, flattens source scan format into broad-side ATE patterns.
  • Supports scan data compression of target ATE.
  • Supports multiple waveform tables.
  • Supports vector repeats and loops.
  • Provides filters for eliminating artifacts contained in the STIL/WGL files from EDA tools.
  • Low cost.
  • Enables usage of standard ATE w/o scan hardware for scan test.